Specification Coverage Aided Test Selection

Reference:

Tuomo Pyhälä and Keijo Heljanko. Specification coverage aided test selection. In Johan Lilius, Felice Balarin, and Ricardo J. Machado, editors, Proceeding of the 3rd International Conference on Application of Concurrency to System Design (ACSD'2003), pages 187–195, Guimaraes, Portugal, June 2003. IEEE Computer Society.

Abstract:

In this paper test selection strategies in formal conformance testing are considered. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.

Keywords:

conformance testing, coverage, bounded model checking

Suggested BibTeX entry:

@inproceedings{PyhHel:ACSD2003,
    address = {Guimaraes, Portugal},
    author = {Tuomo Pyh{\"a}l{\"a} and Keijo Heljanko},
    booktitle = {Proceeding of the 3rd International Conference on Application of Concurrency to System Design (ACSD'2003)},
    editor = {Johan Lilius and Felice Balarin and Ricardo J. Machado},
    month = {June},
    pages = {187--195},
    publisher = {IEEE Computer Society},
    title = {Specification Coverage Aided Test Selection},
    year = {2003},
}